2017 Program
Day 1 – March 21, 2017 – Boston, MA
08:00 – 08:45 Breakfast and Registration
08:45 – 09:00 Welcome Remarks: SELSE General and Program Chairs
09:00 – 10:00 Session I: Keynote Speech (Chair: Paolo Rech)
Tolerating Hardware Faults in Commodity Software:
Problems, Solutions and a Roadmap
Prof. Karthik Pattabiraman
10:00 – 10:30 Coffee Break
10:30 – 11:45 Session II: Characterization Studies (Chair: Kapil Arya)
- A System-Level Voltage/Frequency Scaling Characterization Framework for Multicore CPUs
- System Call Logs with Natural Random Faults: Experimental Design and Application
- Characterizing The Impact of Soft Errors Across Microarchitectural Structures and Implications for Predictability
11:45 – 13:00 Lunch
13:00 – 14:15 Session III: Application Resilience (Chair: John Daly)
- Evaluation and Mitigation of Neural Network-based Object Detection in Three GPU Architectures
- Evaluating the Effects of Input Parameters on Program Vulnerability in GPU Applications
- Exploiting the Tradeoff between Program Accuracy and Soft-error Resiliency Overhead for Machine Learning Workloads
14:15 – 15:15 Session IV: Keynote Speech (Chair: Mattan Erez)
Approximate Computing: It’s not just good, it’s good enough!
Prof. Michael Carbin
15:15 – 16:45 Session V: Poster Session (Chair: Alan Wood) and Coffee Break
- Soft Error Hardened Flip-Flop Based on a Novel Bulk Potential Management Technique
- Reliability Analysis of Feed-Forward Artificial Neural Networks in System on Chips
- Adapting the DMTCP Plugin Model for Checkpointing of Hardware Emulation
- Temperature Dependence of SER Performance in 14nm FinFET Technology
- Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery
- Exploiting the Tradeoff between Program Accuracy and Soft-error Resiliency Overhead for Machine Learning Workloads
16:45 – 17:30 SELSE Business Meeting
18:00 Reception and Banquet
Day 2 – March 22, 2017 – Boston, MA
08:00 – 08:30 Breakfast
08:30 – 09:30 Session VI: Keynote (Chair: David Kaeli)
Memory Errors in Modern Systems
Dr. Vilas Sridharan, AMD
09:30 – 10:00 Coffee Break
10:00 – 11:15 Session VII: Evaluation Tools (Chair: Paolo Rech)
- Preliminary Results of ChipIr; a new Atmospheric-like Neutron Beamline for the Irradiation of Microelectronics
- A Fine-grained; Accountable; Flexible; and Efficient Soft Error Fault Injection Framework for Profiling Application Vulnerability
- Software Marking for Cross-Layer Architectural Vulnerability Estimation Model
11:15 – 12:15 Session VIII: Panel Discussion (Chair: Dan Alexandrescu)
Topic: Beam Experiments: Industry, Academia, and Facility Experiences
Panelists: Vilas Sridharan, Carlo Cazzaniga, Ethan Cascio, Siva Hari, Paolo Rech
12:00 – 13:30 Lunch
13:30 – 14:55 Session IX: Process Variability and Aging (Chair: Siva Hari)
- DRAM Scaling Error Evaluation Model with Variable Retention Time
- Deep Healing: Ease the BTI and EM Wearout Crisis by Activating Recovery
- ASAR: Application-Specific Approximate Recovery to Mitigate Hardware Variability
15:00 – 16:00 Session X: Random Access (Chair: TBD)
16:00 Closing Remarks