2015 Call for Participation

Call for Participation
Workshop on Silicon Errors in Logic � System Effects
(SELSE 2015)
Austin TX � March 30 – April 1, 2015
Deadline to Register to Submit a Paper: January 2, 2015 | Paper Submission Deadline: January 2, 2015

NOTE TO AUTHORS: Paper submission deadlines are earlier than for previous SELSE workshops.

The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching. Growading concern about intermittent errors, unstable storage cells, and the effects of aging are influencing system design and failures in memories account for a significant fraction of costly product returns. Emerging logic and memory device technologies introduce several reliability challenges that need to be addressed to make these technologies viable. Finally, reliability is a key issue for large-scale systems, such as those in data centers. The SELSE workshop provides a forum for discussion of current research and practice in system-level error management. Participants from industry and academia explore both current technologies and future research directions (including nanotechnology). SELSE is soliciting papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies are also solicited.

Key areas of interest are (but not limited to):

  • Technology trends and the impact on error rates.
  • New error mitigation techniques.
  • Characterizing the overhead and design complexity of error mitigation techniques.
  • Case studies describing the tradeoffs analysis for reliable systems.
  • Experimental silicon failure data.
  • System-level models: derating factors and validation of error models.
  • Error handling protocols (higher-level protocols for robust system design).
  • Characterization of reliability of systems deployed in the field and mitigation of issues.
Authors are requested to register to submit a paper by January 2nd,�2015�and to submit their paper for review by January 2nd,�2015. Papers will be considered for both oral and poster presentation and all accepted submissions will be distributed to SELSE participants. Authors will be notified by February 6th, 2015. Final papers are due on February 23rd, 2015.
Submissions and final papers should be in PDF following IEEE two-column conference proceedings format that does not exceed six printed pages. Papers are not made available through IEEE and authors retain the copyright of their work. Authors may optionally choose to make their presentations available online at the workshop web site.

Important dates:

  • Register to submit a paper: December 8, 2014  January 2, 2015
  • Paper submission: December 15, 2014  January 2, 2015
  • Authors notification: January 30, 2015  February 6, 2015
  • Final paper submission: February 18, 2015  February 23, 2015