2022 SELSE – Silicon Errors in Logic – System Effects

The 18th IEEE Workshop on Silicon Errors in Logic – System Effects

SELSE 2022

Best paper awards

Three SELSE’22 best papers have been selected based on the scores obtained in the review process.
These papers will participate in the “Best of SELSE” session at the IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) 2022, that will be held in Baltimore (Maryland, USA) from June 27 to 30. Below, the list of SELSE 2022 best papers.

  • Reliability of Google’s Tensor Processing Units for Convolutional Neural Networks
    Rubens Luiz Rech Junior, Paolo Rech
  • Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks
    Nikolaos Deligiannis, Riccardo Cantoro, Matteo Sonza Reorda, Marcello Traiola, Emanuele Valea
  • Reliability assessment of Real-time Operating System in Embedded Systems
    Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino


May 19 – May 20, 2022, Virtual Event*

The growing complexity and shrinking geometries of modern manufacturing technologies are making devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high performance applications. 
The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.
We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2022. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Baltimore, Maryland, USA, June 27-30, 2022.


Key areas of interest include (but are not limited to):

  • Error rates and trends in current and emerging technologies, including experimental failure data and reliability characterization of deployed systems.
  • New error mitigation techniques, fault-injection tools, robust software frameworks, and error handling protocols for resilient system design.
  • Case studies analyzing the overhead, effectiveness, and design complexity of error mitigation techniques.
  • Resilience characterization and strategies for machine learning applications.
  • Resilience of emerging platforms, cyber-physical and autonomous systems including  autonomous vehicles.
  • Resilience in new architectures, for example accelerator-rich systems and inexact or approximate computing.
  • The design of resilient systems for space exploration.
  • The interplay between system security issues and reliability including adversarial attacks/systems.
  • Program-level error propagation/characterization and visualization of fault tolerance.     

Important dates:

Paper Registration (mandatory):  January 28 February 11, 2022 (extended)
Paper Submission (for registered papers):     February 04 February 18, 2022 (extended)
Author Notification:    March 11, 2022 March 25, 2022
Camera-Ready Submission:  March 25, 2022 April 8, 2022

IEEE Privacy Policy
* As a virtual event, SELSE attendees will have:

  • lower registration fees
  • higher networking possibility
  • higher flexibility for attending and presenting