SELSE – Silicon Errors in Logic – System Effects

The 19th IEEE Workshop on Silicon Errors in Logic – System Effects

SELSE 2023

March 23 – March 24, 2023, Virtual Event (Free registration, High flexibility, Great Networking Opportunity!)

The growing complexity and shrinking geometries of modern manufacturing technologies are making high-density, low-voltage devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and for high-performance applications. In the context of space and automotive applications, the rapid market evolution and the increase in complexity of electronic devices call for new methodologies to verify and increase the reliability of current and future COTS products.

SELSE provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.

The best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2023. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Porto, Portugal, June 27-30, 2023.

 

Areas

Key areas of interest include (but are not limited to):

  • Error rates and trends in current and emerging technologies, including experimental failure data and characterization of deployed systems.
  • New error mitigation techniques, robust software frameworks, and error handling protocols for resilient system design.
  • New approaches to the robustness verification of complex safety-critical systems.
  • Case studies analyzing the overhead, effectiveness, and design complexity of error mitigation techniques, also for space exploration systems.
  • Resilience characterization and strategies for machine learning applications, including autonomous vehicles.
  • Resilience in new architectures, such as accelerator-rich systems and inexact or approximate computing.
  • The interplay between system security issues and reliability.
  • Errors evaluation and mitigation on quantum computers and algorithms.

Important dates:

Paper Registration (mandatory):  December 23, 2022
Paper Submission (for registered papers):    January 09, 2023
Author Notification:    February 15, 2023
Camera-Ready Submission:  February 20, 2023

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